janeiro 2015 vol. 1 num. 3 - International Symposium on Crystallography

Abstract - Open Access.

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RIETVELD REFINEMENT IN SUPER DUPLEX STAINLESS STEEL

Lima, A. N. C.; Muniz, F. T. L.; Batista, A. M. L.; Sasaki, J. M.;

Abstract:

A X-ray powder diffraction patterns can provide many structural information, for instance, distance between atomic planes, preferential orientation and microstrain/crystallite size. Computer programs based on the Rietveld refinement method are commonly used to extract structural parameters as well as the instrumental parameters. However, many of these programs are not applied in rolled steels that present high level of microstrain and texture. This work presents a computer program capable of performing Rietveld refinement in laminated super duplex steel samples using adapted model for a number of preferred orientations[1]. The simulation of x-ray powder diffraction patterns of martensite and austenite phases for two analytical distributions function for microstrain, will be shown. The instrumental parameters such as, flat surface, axial divergence, specimen transparency and receiving slit functions[2] were determined using two standard reference samples (LaB6 and CeO2).

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DOI: 10.5151/phypro-sic100-056

Referências bibliográficas
Como citar:

Lima, A. N. C.; Muniz, F. T. L.; Batista, A. M. L.; Sasaki, J. M.; "RIETVELD REFINEMENT IN SUPER DUPLEX STAINLESS STEEL", p. 56 . In: Proceedings of the International Symposium on Crystallography [Blucher Physics Proceedings, v.1, n.3]. São Paulo: Blucher, 2015.
ISSN 2358-2359, DOI 10.5151/phypro-sic100-056

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