Jianlei Kuang, Wenbin Cao,
Stacking Faults Induced High Dielectric Permittivity of SiC Wires: Preparation, Mechanism and Properties,
Blucher Material Science Proceedings,
Volume 1,
2014,
Pages 89-89,
ISSN 23589337,
http://dx.doi.org/
(www.proceedings.blucher.com.br/article-details/stacking-faults-induced-high-dielectric-permittivity-of-sic-wires-preparation-mechanism-and-properties-10787)
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