TY - CONF
T1 - Stacking Faults Induced High Dielectric Permittivity of SiC Wires: Preparation, Mechanism and Properties
JO - Blucher Material Science Proceedings
VL - 1
IS - 1
SP - 89
EP - 89
PY - 2014
T2 - 13th International Symposium on Multiscale, Multifunctional and Functionally Graded Materials
AU - , 

SN - 23589337
DO - http://dx.doi.org/
UR - www.proceedings.blucher.com.br/article-details/stacking-faults-induced-high-dielectric-permittivity-of-sic-wires-preparation-mechanism-and-properties-10787
KW - 
ER -