TY - CONF T1 - Stacking Faults Induced High Dielectric Permittivity of SiC Wires: Preparation, Mechanism and Properties JO - Blucher Material Science Proceedings VL - 1 IS - 1 SP - 89 EP - 89 PY - 2014 T2 - 13th International Symposium on Multiscale, Multifunctional and Functionally Graded Materials AU - Kuang,Jianlei AU - Cao,Wenbin SN - 2358-9337 DO - http://dx.doi.org/10.5151/matsci-mmfgm-168 UR - https://www.proceedings.blucher.com.br/ KW - Stacking Fault, Dielectric Permittivity, SiC wire ER -