setembro 2014 vol. 1 num. 2 - V Encontro Científico de Física Aplicada

Artigo Completo - Open Access.

Idioma principal

Synchrotron diffraction characterization of alternative powder diffraction standards

Martinez, L. G.; Ichikawa, R. U.; Imakuma, K.; Orlando, M. T. D.; Turrillas, X.;

Artigo Completo :

A set of standard reference materials (SRM) for powder diffraction were developed at the Laboratory of Applied Crystallography of the Nuclear and Energy Research Institute - IPEN/CNEN, aiming to offer an alternative to the expensive standards produced and sold by the US National Institute of Standards and Technology - NIST. The materials studied as standards were high purity samples of CeO2, Y2O3, Si and Al2O3 submitted to thermal treatments and careful selection by sieving. These standard materials were characterized by diffraction at two synchrotron sources and were compared to the NIST ones. The results show that the produced SRM’s present quality similar or, in some cases, superior to the NIST ones.

Artigo Completo :

Palavras-chave: standard reference materials, powder diffraction, synchrotron,

Palavras-chave:

DOI: 10.5151/phypro-ecfa-051

Referências bibliográficas
  • [1] LANGFORD, J. I.; LOUER, D. Power Diffraction. Rep. Prog. Phys. v. 59, p.131–234, 1996.
  • [2] GALVÃO, A. S. A. Desenvolvimento de amostras padrão de referência para difratometria. 95 p. MSc. Dissertation (Nuclear Technology), Programa de Pós-Graduação em Tecnologia Nuclear, Instituto de Pesquisas Energéticas e Nucleares, Universidade de São Paulo, São Paulo, 2011 (in portuguese).
  • [3] MARTINEZ, L. G.; ORLANDO, M. T. D.; CORRÊA, H P S; FERREIRA, F. F.; PAIVA-SANTOS, C. O. Production of standard reference samples for powder diffraction. 18º Congresso Brasileiro de Engenharia e Ciência dos Materiais, 2008, Porto de Galinhas, PE. 2008.
  • [4] TURRILLAS, X.; MARTINEZ, L.G.; IMAKUMA, K.; ICHIKAWA, R. U. Characterization of Alternative Standard Reference Materials for Conventional and Synchrotron X-Ray Powder Diffraction. ALBA User Meeting 2013, Cerdanyola del Vallès, Spain. Proceedings of the ALBA User Meeting 2013. v. 1.
Como citar:

Martinez, L. G.; Ichikawa, R. U.; Imakuma, K.; Orlando, M. T. D.; Turrillas, X.; "Synchrotron diffraction characterization of alternative powder diffraction standards", p. 115-117 . In: Anais do V Encontro Científico de Física Aplicada [= Blucher Physics Proceedings, n.1, v.1]. São Paulo: Blucher, 2014.
ISSN 2358-2359, DOI 10.5151/phypro-ecfa-051

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