setembro 2014 vol. 1 num. 2 - V Encontro Científico de Física Aplicada

Artigo Completo - Open Access.

Idioma principal

Development of a methodology for the application of the Warren-Averbach method

Ichikawa, R. U.; Martinez, L.G.; Imakuma, K.; Turrillas, X.;

Artigo Completo :

The objective of this work was the development of a methodology to speed up the application of the Warren-Averbach method of X-ray line profile analysis to determine the mean crystallite size and microstrain in polycrystalline materials. A computer program was developed in Python programming language to implement a Discrete Fourier Transform (DFT) algorithm instead of other such as the Fast Fourier Transform, and then used to apply the Stokes deconvolution method to correct the instrumental contribution in the X-ray profiles.

Artigo Completo :

Palavras-chave: Warren-Averbach method, computer program, X-ray line profile analysis.,

Palavras-chave:

DOI: 10.5151/phypro-ecfa-049

Referências bibliográficas
  • [1] SMITH, F.: Industrial Applications of X-Ray Diffraction. CRC Press. 1999.
  • [2] YOUNG, R. A., et al.: User''s Guide to Program DBWS-9807a for Rietveld Analysis of X-ray and Neutron Powder Diffraction Patterns. School of Physics, Georgia Institute of Technology, Atlanta GA, USA. 1999.
  • [3] TOBY, B. H. J. Appl. Cryst., v. 34, p. 210-213, 2001.
  • [4] RODRIGUEZ-CARVAJAL, J. FULLPROF, Reference Guide, Laboratire Leon Brillouin (CEA-CNRS), 199
  • [5] LEONI, M. Z. Kristallogr. Suppl., v. 23, p. 249-254, 2006.
  • [6] WARREN, B. E.; AVERBACH, B. L. J. Appl. Phys., v. 21, p. 595-599 , 1950.
  • [7] KRILL, C. E.; BIRRINGER, R. Philos. Mag. A, v. 77, p. 621-640, 1998.
  • [8] ARFKEN, G. B.; Weber, H. J.: Mathematical Methods for Physicists. Academic Press. 2005
  • [9] KANI, A. N.: Signals and Systems. Tata McGraw Hill. New Delhi. 2010.
  • [10] BERTAUT, F. C. R. Acad. Sci. Paris., v. 228, p. 187-189, 1949.
  • [11] ICHIKAWA, R. U. , M.Sc. Dissertation, University of São Paulo, São Paulo, Brazil, 2013.
  • [12] BALZAR, D. and LEDBETTER, H.: J. Appl. Cryst., v. 26, p. 97-103, 1993.
  • [13] MARTINEZ, L. G., M.Sc. Dissertation, University of São Paulo, São Paulo, Brazil, 1989.
  • [14] SAVITZKY, A.; GOLAY, M. J. E. Anal. Chem., v. 36, p. 1627-1639, 1964.
  • [15] KLUG, H. P.; ALEXANDER, L. E.: X-ray Diffraction Procedures: For Polycrystalline and Amorphous Materials, John Wiley Andamp; Sons, New York, NY, USA, 2nd edition, 1974.
  • [16] STOKES, A. R., Proc. Phys. Soc., v. 61, p. 382-391, 1948.
  • [17] BALZAR, D. et al., J. Appl. Cryst., v. 37 p. 911- , 2004.
Como citar:

Ichikawa, R. U.; Martinez, L.G.; Imakuma, K.; Turrillas, X.; "Development of a methodology for the application of the Warren-Averbach method", p. 107-110 . In: Anais do V Encontro Científico de Física Aplicada [= Blucher Physics Proceedings, n.1, v.1]. São Paulo: Blucher, 2014.
ISSN 2358-2359, DOI 10.5151/phypro-ecfa-049

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